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Proceedings Paper

Metal-Optics Scatter Measurements
Author(s): R. P. Young
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Paper Abstract

Many applications using metal optics require that the optical elements have very low scattering surfaces. A scatterometer suitable for measuring the scattering properties of metal mirror has been developed at AEDC. The scatterometer operates at two wavelengths, 0. 6328 and 10. 6 μm. Tests required to evaluate the performance of the scatterometer are described, and the directional scattering data off a high quality metal mirror are presented.

Paper Details

Date Published: 15 January 1976
PDF: 6 pages
Proc. SPIE 0065, Design, Manufacture and Application of Metal Optics, (15 January 1976); doi: 10.1117/12.954513
Show Author Affiliations
R. P. Young, Arnold Engineering Development Center (United States)


Published in SPIE Proceedings Vol. 0065:
Design, Manufacture and Application of Metal Optics
William P. Barnes, Editor(s)

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