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Proceedings Paper

Electronic Processing In Flaw Detection
Author(s): T. S. Huang
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Paper Abstract

We discuss very briefly how electronic, especially digital, techniques, could help flaw detection in three areas: cueing, automatic detection, and internal flaw detection.

Paper Details

Date Published: 20 October 1975
PDF: 2 pages
Proc. SPIE 0060, Solving Quality Control and Reliability Problems with Optics, (20 October 1975); doi: 10.1117/12.954381
Show Author Affiliations
T. S. Huang, Purdue University (United States)


Published in SPIE Proceedings Vol. 0060:
Solving Quality Control and Reliability Problems with Optics
Juan J. Amodei; Harry N. Lowell, Editor(s)

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