Share Email Print
cover

Proceedings Paper

Review Of Noise Reduction Techniques In Coherent Optical Processing Systems
Author(s): J. B. DeVelis; Y. M. Hong; G. O. Reynolds
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The sources of noise present in coherent optical systems are reviewed and classified according to their origin. It is shown that the ultimate limit of image quality is the noise present in the film. The measurable film parameters (MTF, granularity, resolution limit, and threshold modulation) influencing the performance of coherent optical processing systems are combined to set forth a performance criterion that defines the image quality attainable in a given experiment. Sources of noise originating within the system, rather than from the film, can be lessened or eliminated by various techniques that effectively reduce the degree of spatial and/or temporal coherence of the system. These techniques create an ensemble of random noise patterns superimposed upon a stationary image. This superposition averages the noise to a uniform background and reduces the contrast of the image. This system noise reduction leaves the film noise as the limiting parameter in the system. Both holographic and coherent imaging experiments are compared in terms of noise reduction techniques. Five experimental procedures to be considered when designing a coherent optical system with minimum noise are recommended, and examples of their application are demonstrated.

Paper Details

Date Published: 1 March 1974
PDF: 27 pages
Proc. SPIE 0052, Coherent Optical Processing, (1 March 1974); doi: 10.1117/12.954179
Show Author Affiliations
J. B. DeVelis, Technical Operations (United States)
Y. M. Hong, Technical Operations (United States)
G. O. Reynolds, Technical Operations (United States)


Published in SPIE Proceedings Vol. 0052:
Coherent Optical Processing
H. John Caulfield, Editor(s)

© SPIE. Terms of Use
Back to Top