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Proceedings Paper

PCI express bus design of large format array IRFPA high-speed acquisition system
Author(s): Zewu Huang; Xing Zheng; Xingxin Zeng; Ziji Liu
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Paper Abstract

In this paper, a novel solution of PCI Express Bus was designed to improve the data transfer rate for large format array infrared imaging acquisition system. In this structure, an embedded PCI Express hard intellectual property (IP) block of Stratix IV GX FPGA was used, and the protocol stack module is totally compliant with PCI Express base specification Gen 2.0 which includes PHY-MAC, Data Link, and transaction layers. In order to communicate with CPU through computer PCIe root port, a pipeline structure was established with two SSRAMs to carry out the function of real-time data process. The DMA mode was adopted for the high-speed data transmission on the PCI Express Bus. Some other control logic parts such as detector drive signal generator,display controller and PCIe configuration module were also designed and introduced in this paper. According to the evaluation, the data transmission speed was up to 5.6Gbps, which means that this system could meet the qualifications of infrared imaging data acquisition. Compared with traditional infrared imaging data acquisition systems, this solution is more integrated and faster, so it is suitable for larger format and higher frame rate of infrared focal plane image acquisition in nowadays and future.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172K (15 October 2012); doi: 10.1117/12.954132
Show Author Affiliations
Zewu Huang, Univ. of Electronic Science and Technology of China (China)
Xing Zheng, Univ. of Electronic Science and Technology of China (China)
Xingxin Zeng, Univ. of Electronic Science and Technology of China (China)
Ziji Liu, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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