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Proceedings Paper

Infrared Coatings For 2-15 um
Author(s): Robert H. Miller; Graeme Hennessey
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Paper Abstract

This paper addresses the following aspects of 2-15 μm infrared coating technology: theoretical design and analysis, properties of film and substrate materials, spectrophotometric measurement techniques, and examples of principle coating designs. Theoretical investigations are carried out using a self-optimizing multilayer thin film design program as well as classical Herpin design techniques. Optimization examples are given to illustrate the results. It is shown how the computer can be used to predict the degree of difficulty in manufacturing some types of infrared coating designs. Examples are given showing how the performance of bandpass filter designs is influenced by the f-number of the incident light beam and absorption in the film layers. Our principle instrument for infrared measurements is the Perkin-Elmer 180 Spectrophotometer, and we outline the techniques used for low temperature measurements, specular reflectance measurements, polarization measurements, and ATR measurements of our evaporated coatings. Finally, a representative selection of coatings spanning the 2-15 μm range is presented and discussed, including narrow and broadband anti-reflection coatings, bandpass filters, short and long wave pass filters, laser reflectors, and black mirrors.

Paper Details

Date Published: 1 March 1974
PDF: 24 pages
Proc. SPIE 0050, Optical Coatings: Applications and Utilization I, (1 March 1974); doi: 10.1117/12.954109
Show Author Affiliations
Robert H. Miller, Valpey Corporation (United States)
Graeme Hennessey, Valpey Corporation (United States)


Published in SPIE Proceedings Vol. 0050:
Optical Coatings: Applications and Utilization I
Gary W. DeBell; Douglas H. Harrison, Editor(s)

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