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Proceedings Paper

Effects And Measurement Of Scattering And Absorption Of Thin Films
Author(s): Jay M. Eastman
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Paper Abstract

The ultimate performance of optical interference filters is often limited by absorption and scattering losses in the coating materials. A basic understanding of these loss mechanisms is necessary to place realistic specifications on a given optical coating. This paper reviews the theories of absorption and scattering as they relate to optical thin films and stresses those aspects most relevant to the optical systems design engineer. Several methods are currently used to measure the absorption and scattering characteristics of substrates and coating materials. These techniques are discussed in sufficient detail to aid in the determination of which method is applicable to a particular problem.

Paper Details

Date Published: 1 March 1974
PDF: 26 pages
Proc. SPIE 0050, Optical Coatings: Applications and Utilization I, (1 March 1974); doi: 10.1117/12.954106
Show Author Affiliations
Jay M. Eastman, Spectra-Physics (United States)

Published in SPIE Proceedings Vol. 0050:
Optical Coatings: Applications and Utilization I
Gary W. DeBell; Douglas H. Harrison, Editor(s)

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