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Proceedings Paper

Precision Measurement Of Hyperfine Structure In I[sub]2[/sub]
Author(s): L. A. Hackel; D. G. Youmans; S. Ezekiel
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Paper Abstract

In this paper we report precision studies of I2127 hyperfine structure using laser molecular-beam techniques. A single-frequency 5145 Å argon laser tunable over 0.1 Å was used to excite a molecular beam of 12 at right angles. The induced fluorescence was collected by a lens system and focused onto a photomultiplier. The I2 transitions excited were the hyperfine compo-nents of the P(13) and R(15), 43-0 lines between the z, and 31-1 electronic states. go u The hyperfine frequency spacings were precisely determined by counting the beat frequency between two lasers that were long-term stabilized to various hyperfine lines. The standard deviation of the measurements was approximately 25 kHz. The measured spectrum was fitted to obtain a quadrupole coupling strength difference AeQq= 1894.48 . 36 MHz and a spin-rotation interaction strength difference AC, = 190.7 ± 1.5 kHz between the upper and lower levels of the P(13) transition. For the R(15) transition, we obtained AeQq = 1894. 66 ± .40 MHz and ACI = 187.1 ± 2. 0 kHz. High-resolution line - shape studies were performed using a long-term stabilized laser and an acousto-optic tuning method. The measured width of the individual I2 transi-tions was 140 kHz (FWHM). By taking into account broadening from the geometric Doppler width, laser jitter, and other small effects, an estimate of 70 kHz (FWHM) for the natural linewidth was obtained which was in excellent agreement with lifetime mea-surements. Attempts to fit the observed line shapes showed clear Lorentzian features. Taking account of the natural linewidth, the instrumental resolution was ≈70 kHz or one part in 1010.

Paper Details

Date Published: 1 March 1974
PDF: 5 pages
Proc. SPIE 0049, Impact of Lasers in Spectroscopy, (1 March 1974); doi: 10.1117/12.954101
Show Author Affiliations
L. A. Hackel, Massachusetts Institute of Technology (United States)
D. G. Youmans, Massachusetts Institute of Technology (United States)
S. Ezekiel, Massachusetts Institute of Technology (United States)

Published in SPIE Proceedings Vol. 0049:
Impact of Lasers in Spectroscopy
Shaoul Ezekiel; Stanley M. Klainer, Editor(s)

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