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Proceedings Paper

Trends In The Development Of Otf Measuring Equipments
Author(s): K.-J. Rosenbruch
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Paper Abstract

The special demands for OTF measuring instruments are discussed. The development of commercially available instruments from direct measuring instruments to highly sophisticated devices is described, as a trend from complicated test-charts and mechanical set-ups to simpler slit-imaging systems and use of minicomputers integrated in the instruments. A survey of 8 commercial instruments showing different steps of this trend is given.

Paper Details

Date Published: 1 June 1974
PDF: 8 pages
Proc. SPIE 0046, Image Assessment and Specification, (1 June 1974); doi: 10.1117/12.953977
Show Author Affiliations
K.-J. Rosenbruch, Physikalisch-Technische Bundesanstalt (Germany)

Published in SPIE Proceedings Vol. 0046:
Image Assessment and Specification
David T. Dutton, Editor(s)

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