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Proceedings Paper

Thermal Properties Of Hot-Pressed Cadmium Sulfide And Hot-Pressed Magnesium Fluoride
Author(s): M. Jirmanus; N. Jirmanus; W. M. Chu Wang; K. A . McCarthy; H. H. Sample
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Paper Abstract

Two thermal quantities, namely specific heat and thermal conductivity, of hot-pressed cadmium sulfide (a semiconductor) and hot-pressed magnesium fluoride (an insulator) have been measured at low temperatures; such characteristics of these materials as have been determined from analyses of the specific heat data and the thermal conductivity data will be discussed, and will be compared with similar results on single crystal samples of the same materials. The particular hot-pressed samples on which our measurements were made were purchased from the Eastman Kodak Co. (CdS) and the Harshaw Chemical Co. (MgF). Our single crystal CdS was an ultrt high-purity sample purchased from the Eagle-Picher Co. In studying the thermal properties of hot-pressed materials one finds that the hot pressing temperature is probably significant (although detailed information is not available), that impurities and defects are introduced into the material in the preparation process (but not to the extent of measurably altering the density), and that the composite material consists of small crystallites with hexagonal structure in the case of CdS and rutile structure for These structures have been verified in our laboratory by X-ray powder patterns. The grain sizes in our specimens were determined from scanning electron micrographs to be about 2.1 microns and 0.4 microns for CdS and MgF, respectively. It is reasonable to ekpect that grain size might also play an important role in the thermal properties but, as will be shown later, the presence of defects formed in hot-pressing apparently dominates the effects of the small grains.

Paper Details

Date Published: 1 June 1973
PDF: 4 pages
Proc. SPIE 0038, Electro-Optics Principles and Applications, (1 June 1973); doi: 10.1117/12.953750
Show Author Affiliations
M. Jirmanus, Tufts University (United States)
N. Jirmanus, Tufts University (United States)
W. M. Chu Wang, Tufts University (United States)
K. A . McCarthy, Tufts University (United States)
H. H. Sample, Tufts University (United States)

Published in SPIE Proceedings Vol. 0038:
Electro-Optics Principles and Applications
John B. DeVelis; Brian J. Thompson, Editor(s)

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