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Proceedings Paper

Microroughness measurements and EUV calibration of the solar ultraviolet imager multilayer-coated mirrors
Author(s): Dennis Martínez-Galarce; Regina Soufli; David L. Windt; Marilyn Bruner; Eric Gullikson; Shayna Khatri; Eberhard Spiller; Jeff Robinson; Sherry Baker; Evan Prast
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Paper Abstract

The Solar Ultraviolet Imager (SUVI) is one of several instruments that will fly on board the next generation of Geostationary Operational Environmental Satellites (GOES) -R and -S platforms, as part of NOAA's space weather monitoring fleet. SUVI is a Generalized Cassegrain telescope that employs multilayer-coated optics that operate in six extreme ultraviolet (EUV) narrow bandpasses centered at 93.9, 131.2, 171.1, 195.1, 284.2 and 303.8 Å. Once operational, over the mission lifetime expected to last up to 10 years, SUVI will record full disk, EUV spectroheliograms every few minutes, where this data will be used to better understand the effects of solar produced EUV radiation on Earth and the near-Earth environment. The material presented herein will touch upon general aspects of the SUVI optical design, as well as the fabrication, super polishing and metrology of the fabricated mirrors, including measured EUV spectral performance.

Paper Details

Date Published: 15 October 2012
PDF: 19 pages
Proc. SPIE 8501, Advances in Metrology for X-Ray and EUV Optics IV, 85010I (15 October 2012); doi: 10.1117/12.953571
Show Author Affiliations
Dennis Martínez-Galarce, Lockheed Martin Advanced Technology Ctr. (United States)
Regina Soufli, Lawrence Livermore National Lab. (United States)
David L. Windt, Reflective X-Ray Optics LLC (United States)
Marilyn Bruner, Bermar Science & Technology LLC (United States)
Eric Gullikson, Lawrence Berkeley National Lab. (United States)
Shayna Khatri, L-3 Communications Tinsley Labs. Inc. (United States)
Eberhard Spiller, Lawrence Livermore National Lab. (United States)
Jeff Robinson, Lawrence Livermore National Lab. (United States)
Sherry Baker, Lawrence Livermore National Lab. (United States)
Evan Prast, Research Electro-Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 8501:
Advances in Metrology for X-Ray and EUV Optics IV
Lahsen Assoufid; Peter Z. Takacs; Anand Krishna Asundi, Editor(s)

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