Share Email Print

Proceedings Paper

Laser Speckle Metrology
Author(s): J. M. Burch
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

During the past three years several methods have been found for extracting useful information from laser speckle patterns, either visually or by photographic or photoelectric correlation techniques. Speckle interferometers can be used to detect movement or vibration, or to measure inplane strain of a loaded specimen. It is possible that they can be used for desensitised comparison of a succession of diffusely reflecting components against a master shape. As an example of a noninterferometric speckle device, a visual surface depth probe will be considered.

Paper Details

Date Published: 14 October 1971
PDF: 8 pages
Proc. SPIE 0025, Developments in Holography II, (14 October 1971); doi: 10.1117/12.953505
Show Author Affiliations
J. M. Burch, The Institute of Optics (United Kingdom)

Published in SPIE Proceedings Vol. 0025:
Developments in Holography II
Brian J. Thompson; John B. DeVelis, Editor(s)

© SPIE. Terms of Use
Back to Top