Share Email Print
cover

Proceedings Paper

In-House Characterization Technique For Steppers
Author(s): Mircea Dusa; Dan Nicolau
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper propose an user characterization technique for optical steppers. The purpose of such technique is to understand and to control those factors which affect stepper performances when fabrication of structures close or below the resolution specifications of the optical system is required. Two main factors are considered to limit stepper capabilities in submicron lithography: the imaging optics as a transmitter of high spatial frequencies with certain image intensity profile and the photoresist as a receiver of this optical information. The reported experiments use as the resist receiver a positive resist with a basic component added (0-4% by weight) in order to increase the resist transfer function and to decrease the K factor (from Rayleigh two points resolution criteria for isolated patterns, R = Kλ/N.A.). From spectral absorption of the in-house doped resist, we found that doping component concentration makes the process suitable for high resolution/ minimizing reflectivity/stepper target recognition. The imaging optics factors, a 0.31 N.A. /10X and 0.30-0.40 N.A./5X g-line steppers have been tested in the reversed resist process for linewidth change with defocus for various first/second exposure doses;exposure-defocus window;depth of focus for tangential/sagittal 1 micron lines/spaces patterns;lens capabilities to reproduce over all 10x10 mm field horizontal and vertical 1 micron lines. The latter is a useful indication in mixing-and-matching two steppers. Minimum 0.5 micron isolated patterns were reproduced in the reversed process, simultaneously in opposite polarities. The imaging optics was tested also for third order distorsion and errors of 50 ppm at optical field edges could be simply detected.

Paper Details

Date Published: 25 July 1989
PDF: 10 pages
Proc. SPIE 1088, Optical/Laser Microlithography II, (25 July 1989); doi: 10.1117/12.953162
Show Author Affiliations
Mircea Dusa, ICCE / CCSIT-CE Bucuresti (Romania)
Dan Nicolau, ICCE / CCSIT-CE Bucuresti (Romania)


Published in SPIE Proceedings Vol. 1088:
Optical/Laser Microlithography II
Burn Jeng Lin, Editor(s)

© SPIE. Terms of Use
Back to Top