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Proceedings Paper

Fast Measurement Of Refractive Index Profile Parameters ▵ And ∝ In Preforms And Waveguides. Method Of Interference With Plane Wave Of Reference
Author(s): W. Kowalik
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Paper Abstract

A method of fast measurement of parameters ▵ and ∝ describing refractive index profile of preforms and waveguides is discussed. The measurements are performed by means of interference method with plane wave of reference. This method enables application of a simple interferogram scanning, and the calculations resolve themselves into solving of a quadratic equation.

Paper Details

Date Published: 30 January 1990
PDF: 5 pages
Proc. SPIE 1085, Optical Fibres and Their Applications V, (30 January 1990); doi: 10.1117/12.952957
Show Author Affiliations
W. Kowalik, Technical University of Wroclaw (Poland)

Published in SPIE Proceedings Vol. 1085:
Optical Fibres and Their Applications V

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