Proceedings PaperFast Measurement Of Refractive Index Profile Parameters ▵ And ∝ In Preforms And Waveguides. Method Of Interference With Plane Wave Of Reference
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A method of fast measurement of parameters ▵ and ∝ describing refractive index profile of preforms and waveguides is discussed. The measurements are performed by means of interference method with plane wave of reference. This method enables application of a simple interferogram scanning, and the calculations resolve themselves into solving of a quadratic equation.