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Proceedings Paper

Vibration Analysis Using Phase Stepped Pulsed Electronic Speckle Pattern Interferometry
Author(s): F. Mendoza Santoyo; J. R. Tyrer; T. C. West; D. Kerr
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Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) used with cw lasers has so far proved useful only as a laboratory research tool, requiring restrictive environmental conditions and specialist knowledge at the data interpretation stage. A pulsed laser eliminates the need for such requirements mainly due to its shorter pulse duration. The incorporation of a pulsed laser into ESPI provides the high quality fringe data needed to meet the stringent demands of industrial modal analysis. Results obtained with ESPI incorporating a pulsed Neodinium/YAG laser (working at 0.532 μm) are reported in this paper, where the technique was applied to deformation and vibration studies of object areas up to 0.5 m2 in size. The fringe patterns produced are analysed by a phase reduction method to yield out-of-plane amplitude data. The method is easily extended to in-plane sensitivity with very little additional optics. These data may be presented in the form of three dimensional surface displacement maps which may be manipulated by computer for combination with other modal analysis equipment. With the introduction of pulsed laser and a dedicated fringe analysis software and hardware package, ESPI has -now become a commercially viable industrial measurement and analysis tool. A complete description of the system is presented here emphasizing the relevance of the above points and their direct practical applications.

Paper Details

Date Published: 31 July 1989
PDF: 17 pages
Proc. SPIE 1084, Stress and Vibration: Recent Developments in Industrial Measurement and Analysis, (31 July 1989); doi: 10.1117/12.952924
Show Author Affiliations
F. Mendoza Santoyo, Loughborough University of Technology (England)
J. R. Tyrer, Loughborough University of Technology (England)
T. C. West, Loughborough University of Technology (England)
D. Kerr, Loughborough University of Technology (England)


Published in SPIE Proceedings Vol. 1084:
Stress and Vibration: Recent Developments in Industrial Measurement and Analysis

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