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Proceedings Paper

A Stabilized Laser Speckle Strain Gauge
Author(s): Ichirou Yamaguchi; Koichi Kobayashi; Shigesumi Kuwashima
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Paper Abstract

The strain gauge using a speckle correlation method is described. A diffuse object is illuminated with a narrow laser beam and the speckle displacement caused by surface deformation is optoelectronically detected at two symmetrical scattering angles. For this purpose, the hardware correlators, which detects the cross-correlation peak between successive frames of a linear image sensor, have been newly developed. High stability in the measurement has been realized, which could not be attained by using the spatial filtering detectors used earlier. We applied the gauge to extension of a metal plate comparing with a resistance strain gauge and also to extension of polymer films comaring with a displacement transducer. The results are in good agreement at loading velocity between a few millistrain/s and a few tens of millistrain/s. The minimum sensitivity is equal to a few tens of microstrains using linear photodiode arrays of pitch 15 μm. There is no upper limit on the strain to be measured because an incremental strain is integrated. The gauge length, which is given by a beam diameter, is an order of one millimeter.

Paper Details

Date Published: 31 July 1989
PDF: 9 pages
Proc. SPIE 1084, Stress and Vibration: Recent Developments in Industrial Measurement and Analysis, (31 July 1989); doi: 10.1117/12.952904
Show Author Affiliations
Ichirou Yamaguchi, The Institute of Physical and Chemical Research (Japan)
Koichi Kobayashi, Toyo Seiki Co. (Japan)
Shigesumi Kuwashima, OKK Inc. (Japan)

Published in SPIE Proceedings Vol. 1084:
Stress and Vibration: Recent Developments in Industrial Measurement and Analysis
Peter Stanley, Editor(s)

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