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Proceedings Paper

A Resolution Measurement Technique For Large Screen Displays
Author(s): Harry Veron
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Paper Abstract

This paper describes the use of a metric called modulation depth to successfully characterize the resolution of any large screen display (LSD). In addition, a measurement technique was developed to provide for an accurate and repeatable determination of modulation depth. Resolution measurements made on commercially available LSDs with this technique demonstrate its utility in both development and production environments. Finally, a linear systems analysis calculates the modulation depth seen by the observer as a function of distance from the projection screen. This calculation is then related to the actual measurements obtained from the LSDs. As a result of this work, the resolution metric and associated measurement technique should form the basis for an LSD industry standard.

Paper Details

Date Published: 11 July 1989
PDF: 9 pages
Proc. SPIE 1081, Projection Display Technology, Systems, and Applications, (11 July 1989); doi: 10.1117/12.952837
Show Author Affiliations
Harry Veron, The MITRE Corporation (United States)


Published in SPIE Proceedings Vol. 1081:
Projection Display Technology, Systems, and Applications
Frederic J. Kahn, Editor(s)

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