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Proceedings Paper

Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films
Author(s): Brian J. Bartholomeusz
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Paper Abstract

Low conductivity, laser-irradiated thin films such as the chalcogenides employed for optical data storage can display manifestations of signific ant through-thickness thermal gradients. A combined Laplace-transform, Fourier-integral method was utilized to derive the temperature distributions in laser-irradiated, low conductivity thin films, and the results were used to examine the effects of some marking parameters on through-thickness thermal gradients. These were found to be strongly influenced by the laser incidence direction, the coefficient of optical absorption, and the film thickness, and influe:aced to a somewhat lesser degree by the scanning velocity.

Paper Details

Date Published: 19 May 1989
PDF: 10 pages
Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); doi: 10.1117/12.952759
Show Author Affiliations
Brian J. Bartholomeusz, Eastman Kodak Company (United States)

Published in SPIE Proceedings Vol. 1078:
Optical Data Storage Topical Meeting
Gordon R. Knight; Clark N. Kurtz, Editor(s)

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