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Proceedings Paper

A Theoretical Analysis for Media Life Estimation Using Error Rate
Author(s): Hideki Okazaki; Tatsuya Sasaoka; Yasuaki Nakane; Tadashi Kiyomiya; Hiroshi Makino; Tokuei Aoki
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Paper Abstract

Statistical analysis on a life time probability of optical recording media is studied. Byte error rate change under accelerated environments was applied to plot on an Arrhenius' scale. Assuming an error generation model where an error is caused by combination of noise generated in a disk and drive, following equation can be obtained; BER = Ao exp [ C exp( - Ea / kT ) ) • t 1. The analysis result suggested that the life time probability distributed normally on an Arrhenius' time scale. Experimental results on high temperature and high humidity accelerated test were in good agreement with the analysis. The life time of 99.9% our magneto-optical media were expected to be longer than 25 years in an office environment.

Paper Details

Date Published: 19 May 1989
PDF: 9 pages
Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); doi: 10.1117/12.952742
Show Author Affiliations
Hideki Okazaki, Sony Magnetic Products Inc. (Japan)
Tatsuya Sasaoka, Sony Corporation (Japan)
Yasuaki Nakane, Sony Corporation (Japan)
Tadashi Kiyomiya, Sony Corporation (Japan)
Hiroshi Makino, Sony Corporation (Japan)
Tokuei Aoki, Sony Magnetic Products Inc. (Japan)

Published in SPIE Proceedings Vol. 1078:
Optical Data Storage Topical Meeting
Gordon R. Knight; Clark N. Kurtz, Editor(s)

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