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Proceedings Paper

Recent Developments In Large Area Scientific CCD Image Sensors
Author(s): James Janesick; Tom Elliott; Richard Bredthauer; John Cover; Russell Schaefer; Richard Varian
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Paper Abstract

The design and performance of a 1024x1024 pixel charge-coupled device (CCD) imager are described. This device is fabricated utilizing a 3-phase, three-level polysilicon gate process. The chip is thinned and is employed in the back-illumination mode. Detailed measurements including imagery, read noise, full well capacity, charge transfer efficiency, linearity, dark current, spectral response, residual image, and charge collection efficiency are reported.

Paper Details

Date Published: 23 May 1989
PDF: 19 pages
Proc. SPIE 1071, Optical Sensors and Electronic Photography, (23 May 1989); doi: 10.1117/12.952513
Show Author Affiliations
James Janesick, California Institute of Technology (United States)
Tom Elliott, California Institute of Technology (United States)
Richard Bredthauer, Ford Aerospace Corporation (United States)
John Cover, Science Applications International Corporation (United States)
Russell Schaefer, Science Applications International Corporation (United States)
Richard Varian, Science Applications International Corporation (United States)


Published in SPIE Proceedings Vol. 1071:
Optical Sensors and Electronic Photography
Morley M. Blouke; Donald Pophal, Editor(s)

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