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Proceedings Paper

Information- And Image-Processing Of Scanning-Tunneling-Microscope Data
Author(s): E. Stoll
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Paper Abstract

Scanning Tunneling Microscopy (STM) gives information on the topography, chemical composition and electronic structure of metal and semiconductor surfaces down to the atomic scale. The experimental data can be filtered using a Wiener-type or least-square filter to eliminate blurring, to suppress noise, and, in addition, to correct spatial distortions by correlating typical picture elements. The three-dimensional profile of the processed surface picture can then be represented according to techniques developed by map-makers.

Paper Details

Date Published: 16 July 1986
PDF: 9 pages
Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952414
Show Author Affiliations
E. Stoll, IBM Zurich Research Laboratory (Switzerland)

Published in SPIE Proceedings Vol. 0599:
Optics in Engineering Measurement
William F. Fagan, Editor(s)

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