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Proceedings Paper

Automatic Fringe Analysis In Double Exposure And Live Fringe Holographic Interferometry
Author(s): D. W. Robinson; D. C. Williams
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Paper Abstract

In general the automatic analysis of double exposure and live fringe holographic interferograms requires different and complementary approaches to the development of digital image processing software. In the former case, intensity pattern analysis must be performed, whereas in the latter, phase modulation techniques are applicable. Examples of both types of analysis will be presented, in the context of developing holographic measurement systems for use in the determination of surface deformation and strain fields in engineering components.

Paper Details

Date Published: 16 July 1986
PDF: 7 pages
Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952365
Show Author Affiliations
D. W. Robinson, The National Physical Laboratory (England)
D. C. Williams, The National Physical Laboratory (England)


Published in SPIE Proceedings Vol. 0599:
Optics in Engineering Measurement
William F. Fagan, Editor(s)

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