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Proceedings Paper

Application Of Great Depth Holographic Technique To Double-Exposure Holographic Interferometry
Author(s): Xiong Binghen; Gou Wanfu
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Paper Abstract

Development of the technique of great depth holography applied to the engineering measurement is introduced in this paper. In double-exposure holographic interferometry the object is illuminated by multi-beam of object waves with various path difference of even multiple of cavity length. This method is useful for the holographic interferometry applied to large engineering structure.

Paper Details

Date Published: 16 July 1986
PDF: 4 pages
Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952362
Show Author Affiliations
Xiong Binghen, Changsha Railway Institute (China)
Gou Wanfu, Changsha Railway Institute (China)

Published in SPIE Proceedings Vol. 0599:
Optics in Engineering Measurement
William F. Fagan, Editor(s)

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