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Proceedings Paper

Application Of Holographic Contouring To Materials Testing
Author(s): Denis E. Cuche
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Paper Abstract

Two-wavelength holographic contouring for fringe intervals between 5 and 20 microns is studied in detail. Particular attention is given to the fringe visibility and to the position of the reference plane. Dimensional limitations are considered. Measurement of the bending of a glass plate due to shrinkage of the epoxy coating is presented.

Paper Details

Date Published: 16 July 1986
PDF: 9 pages
Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952358
Show Author Affiliations
Denis E. Cuche, Ciba-Geigy AG (Switzerland)


Published in SPIE Proceedings Vol. 0599:
Optics in Engineering Measurement
William F. Fagan, Editor(s)

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