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Proceedings Paper

Investigation Of Integrated Circuits By Holographic Technique
Author(s): Ashraf H. Yahia; Nashwa M. Shaalan
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Paper Abstract

Double exposurs holographic technique is used for mapping the surface temperature distributions of an integrated circuit chip. The same results are obtained from the solution of Poisson's equation in two-dimensions to simulate these thermal fields.

Paper Details

Date Published: 16 July 1986
PDF: 3 pages
Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952354
Show Author Affiliations
Ashraf H. Yahia, Ain Shams University (Egypt)
Nashwa M. Shaalan, Ain Shams University (Egypt)


Published in SPIE Proceedings Vol. 0599:
Optics in Engineering Measurement
William F. Fagan, Editor(s)

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