Share Email Print

Proceedings Paper

Characterization and Measurement of System Stability
Author(s): R. Schieder; G. Rau; B. Vowinkel
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

For the characterization of noise and stability of any measuring instrument a new and very practical method is introduced. It follows the principles of the "Allan variance" well estabilished for the characterization of the stability of frequency standards. The plot of the Allen variance versus integration time enables one to determine the different types of noise power spectra from the output of any instrument. In particular, the best range of the integration time for optimum use of the system can accurately be evaluated. Theoretical considerations and experimental results with components of the 3-m radiotelescope of Univ. of Cologne are presented.

Paper Details

Date Published: 21 April 1986
PDF: 4 pages
Proc. SPIE 0598, Instrumentation for Submillimeter Spectroscopy, (21 April 1986); doi: 10.1117/12.952341
Show Author Affiliations
R. Schieder, Universitat Koln (West Germany)
G. Rau, Universitat Koln (West Germany)
B. Vowinkel, Universitat Koln (West Germany)

Published in SPIE Proceedings Vol. 0598:
Instrumentation for Submillimeter Spectroscopy
Erik L. Kollberg, Editor(s)

© SPIE. Terms of Use
Back to Top