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Proceedings Paper

A Silicon Drift Chamber for Two-Dimensional Particle Detection
Author(s): H. Becker; H. Dietl; E. Gatti; P. Holl; J. Kemmer; R. Klanner; A. Longoni; G. Lutz; P. Rehak; A. Wylie
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Paper Abstract

Semiconductor drift chambers have been recently proposed for particle detection. Their functional principle is similar to gas drift chambers: under the influence of an electric field charge carriers (electrons) are drifting to an anode, where they can be used for energy and/or position measurements.

Paper Details

Date Published: 1 May 1986
PDF: 7 pages
Proc. SPIE 0591, Solid-State Imagers and Their Applications, (1 May 1986); doi: 10.1117/12.952072
Show Author Affiliations
H. Becker, Fachhochschule Saarbrucken (Fed. Rep. Germany)
H. Dietl, Max-Planck-Institut fur Physik (Fed. Rep. Germany)
E. Gatti, Politecnico di Milano (Italy)
P. Holl, Max-Planck-Institut fur Physik (Fed. Rep. Germany)
J. Kemmer, Technische Universitat Munchen (Fed. Rep. Germany)
R. Klanner, Max-Planck-Institut fur Physik (Fed. Rep. Germany)
DESY (Germany)
A. Longoni, Politecnico di Milano (Italy)
G. Lutz, Max-Planck-Institut fur Physik (Fed. Rep. Germany)
P. Rehak, Brookhaven National Laboratory (United States)
A. Wylie, Max-Planck-Institut fur Physik (Germany)
Universite de Geneve (Switzerland)


Published in SPIE Proceedings Vol. 0591:
Solid-State Imagers and Their Applications
Gilbert J. Declerck, Editor(s)

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