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Proceedings Paper

Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging
Author(s): Roger F. Edgar; Bernard J. Stay
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Paper Abstract

Infrared absorption measurement techniques are widely used in both laboratory and production plant, to measure the thickness and composition of extruded polymer films. Recent developments in film production technology permit the manufacture of transparent films of relatively high refractive index with optically flat and parallel surfaces. Since the optical thickness of such films is comparable with the coherence length of the infrared radiation used, optical interference effects can cause serious errors in the measurement. Various strategies for suppression of interference effects are presented and practical techniques based on these strategies are described.

Paper Details

Date Published: 1 May 1986
PDF: 6 pages
Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.952000
Show Author Affiliations
Roger F. Edgar, Infrared Engineering Limited (United Kingdom)
Bernard J. Stay, Consultant (United Kingdom)


Published in SPIE Proceedings Vol. 0590:
Infrared Technology and Applications
Lionel R. Baker; Andre Masson, Editor(s)

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