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Proceedings Paper

Stress Analysis Of Randomly Loaded Structures Using An Infra-Red Technique
Author(s): W. M. Cummings; N. Harwood
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Paper Abstract

The use of infra-red techniques for full field stress analysis has increased rapidly in the last two or three years, due mainly to the introduction of a production model of the SPATE (Stress Pattern Analysis by Thermal Emission) equipment, developed by Sira Ltd. The Sira technique makes use of the thermoelastic effect by measuring the very small temperature changes which occur when structures are cyclically loaded. This paper describes the investigation of structures under broad-band random loading, using a standard SPATE 8000 together with an add-on hardware/software system developed for this purpose at the National Engineering Laboratory.

Paper Details

Date Published: 1 May 1986
PDF: 9 pages
Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951994
Show Author Affiliations
W. M. Cummings, National Engineering Laboratory (Scotland)
N. Harwood, National Engineering Laboratory (Scotland)


Published in SPIE Proceedings Vol. 0590:
Infrared Technology and Applications
Lionel R. Baker; Andre Masson, Editor(s)

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