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Proceedings Paper

Infrared Thermal Mapping Of Microelectronic Circuits
Author(s): Ashraf H. Yahia; Nashwa M. Shaalan
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Paper Abstract

Infrared thermovision technique is used in investigating thermal fields on microelectronic circuits. The recorded thermograms indicate both the chip-thermal distribution and chip faults if any. The results are in agreement with the simulated circuit model used.

Paper Details

Date Published: 1 May 1986
PDF: 4 pages
Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951990
Show Author Affiliations
Ashraf H. Yahia, Ain Shams University (Egypt)
Nashwa M. Shaalan, Ain Shams University (Egypt)


Published in SPIE Proceedings Vol. 0590:
Infrared Technology and Applications
Lionel R. Baker; Andre Masson, Editor(s)

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