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Proceedings Paper

Accuracy Of A Heterodyne Interferometric MTF Measuring Device In The Infrared
Author(s): Roman Boutellier
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Paper Abstract

A heterodyne interferometer was developped to be used in the visible and in the infrared. If the RMS wavefront error is used to determine a datum focal plane, MTF measurements differ by less than 3% from calculated values for two special test lenses. The interferometers are compared to other MTF measuring techniques.

Paper Details

Date Published: 1 May 1986
PDF: 7 pages
Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951975
Show Author Affiliations
Roman Boutellier, Kern & Co. (Switzerland)


Published in SPIE Proceedings Vol. 0590:
Infrared Technology and Applications
Lionel R. Baker; Andre Masson, Editor(s)

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