Share Email Print
cover

Proceedings Paper

Measurement Of H And H[sub]2[/sub] Populations In-Situ In A Low-Temperature Plasma By Vacuum-Ultraviolet Laser-Absorption Spectroscopy
Author(s): A. S. Schlachter; A. T. Young; G. C. Stutzin; J. W. Stearns; H. F. Dobele; K. N. Leung; W. B. Kunkel
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A new technique, vacuum-ultraviolet laser-absorption spectroscopy, has been developed to quantitatively determine the absolute density of H and H2 within a plasma. The technique is particularly well suited to measurement in a plasma, where high charged particle and photon backgrounds complicate other methods of detection. The high selectivity and sensitivity of the technique allows for the measurement of the rotational-vibrational state distribution of H2 as well as the translational temperature of the atoms and molecules. The technique has been used to study both pulsed and continuous IC ion-source plasma discharges. H2 state distributions in a multicusp "volume" If ion-source plasma show a high degree of internal excitation, with levels up to v = 5 and J = 8 being observed. The method is applicable for a very wide range of plasma conditions. Emission measurements from excited states of H are also reported.

Paper Details

Date Published: 25 July 1989
PDF: 7 pages
Proc. SPIE 1061, Microwave and Particle Beam Sources and Directed Energy Concepts, (25 July 1989); doi: 10.1117/12.951848
Show Author Affiliations
A. S. Schlachter, Lawrence Berkeley Laboratory (United States)
A. T. Young, Lawrence Berkeley Laboratory (United States)
G. C. Stutzin, Lawrence Berkeley Laboratory (United States)
J. W. Stearns, Lawrence Berkeley Laboratory (United States)
H. F. Dobele, Universitat Gesamthochschule Essen (Germany)
K. N. Leung, Lawrence Berkeley Laboratory (United States)
W. B. Kunkel, Lawrence Berkeley Laboratory (United States)


Published in SPIE Proceedings Vol. 1061:
Microwave and Particle Beam Sources and Directed Energy Concepts
Howard E. Brandt, Editor(s)

© SPIE. Terms of Use
Back to Top