Share Email Print
cover

Proceedings Paper

Interaction-Volume And Radiation Aperture Area Scaling Relations For High-Power Planar Orotron
Author(s): John Walsh; Jonathan Jackson; Elizabeth Marshall; Lian Dong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The planar orotron structure is a versatile resonator which can be used as the basis for a cm-wavelength microwave generator. In its most elementary form, it consists of a narrow planar grating which is embedded in a conductor and opposed by a second conductor. Cylindrical section mirrors at the ends of the grating complete the resonator. The width of the grating is determined by the width of the driving electron beam. Thus, within limits set by beam stability, transverse scaling of the interaction volume is possible. In addition, the planar geometry allows easy stacking of additional resonators, and this provides a further scaling of the interaction volume. The aperture area of a complete multi-module resonator will increase with the total number of resonators, and this scaling can be used to maintain field strengths in an intense-beam-driven high-power source at levels below the breakdown threshold. A summary of the results needed in order to optimize the performance of a single orotron module will be presented and scaling of multi-resonator structures will be discussed.

Paper Details

Date Published: 25 July 1989
PDF: 8 pages
Proc. SPIE 1061, Microwave and Particle Beam Sources and Directed Energy Concepts, (25 July 1989); doi: 10.1117/12.951810
Show Author Affiliations
John Walsh, Dartmouth College (United States)
Jonathan Jackson, Dartmouth College (United States)
Elizabeth Marshall, Dartmouth College (United States)
Lian Dong, Dartmouth College (United States)


Published in SPIE Proceedings Vol. 1061:
Microwave and Particle Beam Sources and Directed Energy Concepts
Howard E. Brandt, Editor(s)

© SPIE. Terms of Use
Back to Top