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Proceedings Paper

Surface Plasmons As Interfacial Light For The Characterization Of Thin Films
Author(s): Wolfgang Knoll; Benno Rothenhausler; Werner Hickel
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Paper Abstract

This paper deals with the application of plasmon surface polaritions (PSP) for the characterization of thin films, e.g. Langmuir-Blodgett multilayer assemblies. Examples are given for total internal diffraction of PSP by dielectric phase gratings, interferometry at an index step and, finally, recent developments in the new field of PSP imaging and microscopy are presented.

Paper Details

Date Published: 15 August 1989
PDF: 10 pages
Proc. SPIE 1056, Photochemistry in Thin Films, (15 August 1989); doi: 10.1117/12.951615
Show Author Affiliations
Wolfgang Knoll, Max-Planck-Institut fur Polymerforschung (Germany)
Benno Rothenhausler, Max-Planck-Institut fur Polymerforschung (Germany)
Werner Hickel, Max-Planck-Institut fur Polymerforschung (Germany)


Published in SPIE Proceedings Vol. 1056:
Photochemistry in Thin Films
Thomas F. George, Editor(s)

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