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Proceedings Paper

Calibrating A Detector Array Based Spectroradiometer With Sub-Pixel Precision
Author(s): Stephen Scopatz; Gary Neel; Eric Romesburg; Maury Zivitz
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Paper Abstract

Spectrometry utilizing a dispersive element and a multi-element detector array poses several challenges to precise calibration. A classical method of wavelength axis calibration using two spectral lines is inadequate due to the non-linearity of these modern systems. The variation of detector response over the span of the detector array is problematic for the intensity axis calibration. A novel approach to calibrating an Optical Multichannel Analyzer is detailed, as well as test results comparing the assigned and calculated positions of the spectral Hines included in the calibration set. The equipment used is an EG&G PARC model III with Spectrograph. The wavelength axis is calculated by determining the centroid wavelength of the spectral lines used in the calibration routine; this method employs a sub-pixel assignment technique. The non-linearity of this axis is compensated by a numerical integration of the centroid data points. The intensity axis involves a standard technique utilizing a calibrated tungsten source. Included is a background discussion of why various lamps with measured brightness temperatures were determined to be inadequate for calibration. The intensity axis calibration is proportional to the photon count rather than energy (joules), the advantage for this method for our implementation is presented.

Paper Details

Date Published: 5 July 1989
PDF: 8 pages
Proc. SPIE 1055, Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology, (5 July 1989); doi: 10.1117/12.951602
Show Author Affiliations
Stephen Scopatz, Boehringer Mannheim Corporation (United States)
Gary Neel, Boehringer Mannheim Corporation (United States)
Eric Romesburg, Boehringer Mannheim Corporation (United States)
Maury Zivitz, Boehringer Mannheim Corporation (United States)

Published in SPIE Proceedings Vol. 1055:
Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology
Fran Adar; James E. Griffiths; Jeremy M. Lerner, Editor(s)

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