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Proceedings Paper

High Pressure Raman Spectroscopy Of TiO[sub]2[/sub] Thin Films
Author(s): Nancy J. Hess; Gregory J. Exarhos
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Paper Abstract

The pressure dependences of the Raman active modes in submicrometer films of the anatase and rutile crystalline phases of TiO2 have been determined at pressures approaching 90 Kbar. Films investigated have been prepared by reactive sputter deposition and sol-gel techniques. Band frequency shifts as a function of applied pressure for the rutile phase are in agreement with measurements from single crystal samples. However, sol-gel films (anatase) exhibit larger frequency shifts than powder or single crystal samples, and do not undergo the expected pressure-induced phase transformation to the Ti02-II phase. This anomalous pressure response is discussed in terms of the complex film microstructure evaluated from TEM cross-sectional measurements.

Paper Details

Date Published: 5 July 1989
PDF: 10 pages
Proc. SPIE 1055, Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology, (5 July 1989); doi: 10.1117/12.951589
Show Author Affiliations
Nancy J. Hess, University of Washington (United States)
Gregory J. Exarhos, Pacific Northwest Laboratory (United States)


Published in SPIE Proceedings Vol. 1055:
Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology
Fran Adar; James E. Griffiths; Jeremy M. Lerner, Editor(s)

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