Share Email Print

Proceedings Paper

Resonance Enhanced Raman Studies Of As-Grown And Laser-Processed HgCdTe
Author(s): A. Compaan; B. Aggarwal; R. C. Bowman; D. E. Cooper
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Raman spectroscopy in Hgl,Cdje (MCT) is a powerful, nondestructive surface probe of alloy composition and crystallinity. The frequencies and the relative amplitudes of the HgTe-like and CdTe-like phonon modes change with Cd fraction; the E1 and E1 + Δl critical points shift with x-value and strongly influence the Raman spectra obtained with the green and blue lines of the argon laser. We have studied the resonance enhancement of the two LO and two TO modes and a "cluster" mode in as-grown samples of MCT for x-values between 0.20 and 0.31. In addition, we have studied the changes which occur in the Raman spectra after exposure of the MCT surfaces to single pulses from a dye laser with pulse energies above the melt threshold. The Raman spectra show clear evidence of compositional changes near the surface when processing occurs in air. However, when the irradiation occurs in an ambient of ~20 atm. of argon, the major effect is a reduction of the peak associated with a cluster mode. The results are consistent with a strong suppression of clustering after pulsed laser annealing.

Paper Details

Date Published: 5 July 1989
PDF: 9 pages
Proc. SPIE 1055, Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology, (5 July 1989); doi: 10.1117/12.951574
Show Author Affiliations
A. Compaan, The University of Toledo (United States)
B. Aggarwal, The University of Toledo (United States)
R. C. Bowman, The Aerospace Corporation (United States)
D. E. Cooper, Rockwell International (United States)

Published in SPIE Proceedings Vol. 1055:
Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology
Fran Adar; James E. Griffiths; Jeremy M. Lerner, Editor(s)

© SPIE. Terms of Use
Back to Top