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Proceedings Paper

Moire Deflectometry - Applications To Lens Analysis
Author(s): Kathi Kreske; Eliezer Keren; Oded Kafri
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Paper Abstract

Moire deflectometry, a method for ray deflection mapping, is described. Its use in lens testing for determining properties such as surface microstructure, radius of curvature, thickness, aberrations, and OTF (optical transfer function), is demonstrated. Unlike interferometry, moire deflectometry is a ray tracing technique, and therefore the analysis of three dimensional objects is greatly simplified. Although the ray tracing approach to optical systems is much older than wave theory, moire deflectometry seems to be the first attempt to apply ray tracing methods systematically to optical metrology. The technique is fully quantitative, interferometry compatible in accuracy, and has the additional advantage of tunable sensitivity.

Paper Details

Date Published: 5 July 1989
PDF: 10 pages
Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); doi: 10.1117/12.951037
Show Author Affiliations
Kathi Kreske, Rotlex Optics Ltd. (Israel)
Eliezer Keren, Rotlex Optics Ltd. (Israel)
Oded Kafri, Rotlex Optics Ltd. (Israel)

Published in SPIE Proceedings Vol. 1038:
6th Mtg in Israel on Optical Engineering
Rami Finkler; Joseph Shamir, Editor(s)

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