Share Email Print

Proceedings Paper

Waveguide Diffraction Gratings In Integrated Optics
Author(s): L. A. Weller-Brophy; D. G. Hall
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A discussion of the various TE-TE and TM-TM coupling coefficients derived for both normal and oblique incidence to the rulings of a corrugated waveguide diffraction grating is presented. It is shown that the substantial disparity between the TM-TM coupling coefficients can result in vastly different predictions of peak grating reflectivity. We conclude that experimental examination of the coupling coefficients is necessary before the accurate design and analysis of waveguide gratings can be achieved.

Paper Details

Date Published: 11 September 1985
PDF: 5 pages
Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); doi: 10.1117/12.950766
Show Author Affiliations
L. A. Weller-Brophy, University of Rochester (United States)
D. G. Hall, University of Rochester (United States)

Published in SPIE Proceedings Vol. 0578:
Integrated Optical Circuit Engineering II
Sriram Sriram, Editor(s)

© SPIE. Terms of Use
Back to Top