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Proceedings Paper

Methods Of Characterizing Photorefractive Susceptibility Of LiNbO[sub]3[/sub] Waveguides
Author(s): R. A. Becker
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Paper Abstract

Two methods for measuring the photorefractive susceptibility of LiNb03 waveguides are reviewed. Data for waveguides formed by means of Ti indiffusion and also by proton exchange techniques are discussed. The photorefractive effect in channel-waveguide devices is analyzed by means of a model which accurately predicts the time evolution of photorefrac-tive effects. The response of guided-wave Mach-Zehnder interferometers is experimentally evaluated, and the magnitudes of the photovoltaic and photoconductive components which com-prise the photorefractive effect are quantitatively determined. While these initial results were obtained for channel-waveguide devices, the model is believed to be extendable to planar-waveguide devices as well.

Paper Details

Date Published: 11 September 1985
PDF: 7 pages
Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); doi: 10.1117/12.950740
Show Author Affiliations
R. A. Becker, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0578:
Integrated Optical Circuit Engineering II
Sriram Sriram, Editor(s)

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