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Proceedings Paper

Itek Optical Technology In Manufacturing And Metrology
Author(s): I. M. Egdall; R. K. Lee
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Paper Abstract

There is a wide spectrum of optical systems contemplated for use in future astronomy missions. At Itek, the systems range from the large, lightweight, deployable optics required for the large deployable reflector (LDR) to the precision of grazing incidence x-ray optics for the Advanced X-ray Astrophisical Facility (AXAF). This paper describes some of the tech-nological initiatives that Itek has developed to enhance the manufacturability and the measurement of the surface quality of the spectrum of optical assemblies to be manufactured for the astronomical telescopes.

Paper Details

Date Published: 21 February 1986
PDF: 8 pages
Proc. SPIE 0571, Large Optics Technology, (21 February 1986); doi: 10.1117/12.950393
Show Author Affiliations
I. M. Egdall, Itek Optical Systems (United States)
R. K. Lee, Itek Optical Systems (United States)


Published in SPIE Proceedings Vol. 0571:
Large Optics Technology
Gregory M. Sanger, Editor(s)

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