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Proceedings Paper

Computerized Surface Plasmon Microscopy
Author(s): Eric M. Yeatman; Eric A. Ash
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Paper Abstract

A method is presented for calculating the reflectivity of a beam of arbitrary profile, in a prism coupler, which is generating plasmons on a non-uniform surface. The particular case of a line discontinuity is considered, and computations for specific, systems are presented. Implications for various methods of surface plasmon microscopy are discussed, including the use of image processing in a computerized system.

Paper Details

Date Published: 9 February 1989
PDF: 6 pages
Proc. SPIE 1028, Scanning Imaging, (9 February 1989); doi: 10.1117/12.950350
Show Author Affiliations
Eric M. Yeatman, Imperial College of Science and Technology (England)
Eric A. Ash, Imperial College of Science and Technology (England)


Published in SPIE Proceedings Vol. 1028:
Scanning Imaging
Tony Wilson, Editor(s)

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