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Proceedings Paper

HgCdTe Focal Plane Development Concepts
Author(s): M. N. Gurnee; R. M. Broudy
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Paper Abstract

As advanced infrared systems are designed and developed, the requirement for greater sensitivity and resolution is continually encountered. System performance parameters relating to these requirements always depend on the signal-to-noise ratio of the total focal plane. Under optimum operating conditions for the best materials, the response is directly proportional to the total area of sensitive material on the focalplane Ap, whereas the noise varies as Ap1/2 thus system sensitivity varies as Ap1/2. However, resolution depends inversely on the dimensions of the sensitive elements. Thus, higher performance systems will require multielement focal planes of small, closely packed detectors.

Paper Details

Date Published: 11 December 1985
PDF: 7 pages
Proc. SPIE 0570, Solid-State Imaging Arrays, (11 December 1985); doi: 10.1117/12.950324
Show Author Affiliations
M. N. Gurnee, Honeywell Electro-Optics Division (United States)
R. M. Broudy, Honeywell Electro-Optics Division (United States)

Published in SPIE Proceedings Vol. 0570:
Solid-State Imaging Arrays
Eustace L. Dereniak; Keith N. Prettyjohns, Editor(s)

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