Share Email Print

Proceedings Paper

An Accurate Method For Measuring The Spatial Resolution Of Integrated Image Sensors
Author(s): J. Glasser; J. Vaillant; F. Chazallet
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A reasonably simple and accurate method for measuring the spatial resolution of discrete photoelement image sensors was developed. It uses a scanning knife edge as an input pattern. This approach, which is based on rigourous theoretical considerations, gives quicker and more reliable results than the the usual bar pattern method. In addition, it can be fully automated.

Paper Details

Date Published: 2 March 1989
PDF: 8 pages
Proc. SPIE 1027, Image Processing II, (2 March 1989); doi: 10.1117/12.950257
Show Author Affiliations
J. Glasser, CNET Dept COD (France)
J. Vaillant, CNET Dept COD (France)
F. Chazallet, CNET Dept COD (France)

Published in SPIE Proceedings Vol. 1027:
Image Processing II
Peter J.S. Hutzler; Andre J. Oosterlinck, Editor(s)

© SPIE. Terms of Use
Back to Top