Share Email Print
cover

Proceedings Paper

Intensity Profiling The Ultraviolet Laser Beam
Author(s): Paul R. Yoder; William B. Telfair; Clifford A. Martin; Peter S Bennett
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Many applications of ultraviolet (UV) lasers would be greatly facilitated if the designers and users of associated optical systems could characterize the beams as to location, size, shape and intensity distribution at selected points along the optical path. We describe a new technique based upon visible light fluorescence induced into a crystalline plate when irradiated by a UV beam as a means for performing these measurements. Instruments applying this principle and allowing the user to observe the otherwise invisible beam as well as to quantify its intensity profiles using electronic and/or computer analysis methods also are described.

Paper Details

Date Published: 28 March 1989
PDF: 8 pages
Proc. SPIE 1024, Beam Diagnostics and Beam Handling Systems, (28 March 1989); doi: 10.1117/12.950168
Show Author Affiliations
Paul R. Yoder, A Division of Taunton Technologies, Inc. (United States)
William B. Telfair, A Division of Taunton Technologies, Inc. (United States)
Clifford A. Martin, A Division of Taunton Technologies, Inc. (United States)
Peter S Bennett, A Division of Taunton Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1024:
Beam Diagnostics and Beam Handling Systems
Alberto Sona, Editor(s)

© SPIE. Terms of Use
Back to Top