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Proceedings Paper

Characterization Of Nickel Oxide Electrochromic Films
Author(s): Niall R Lynam; Hamid R. Habibi
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Paper Abstract

NicNickel oxide (Ni0) thin films deposited by electron-beam evaporation were studied using Fourier Transform Infrared Spectroscopy(FTIR), Rutherford Backscattering Spectroscopy (RBS), and spectrophotometry. Evaporated nickel oxide films ehibited good electrochromic behavior and a coloring efficiency of 30.1 cm2/C coating was 4.41 g/cc and stoichiometry was Nio1.4; both established by RBS. The infrared spectral properties of the as-deposited film was consistent with the structure being Ni0x. After repetitive electrochromic cycling in 1N KOH, the film changed to a structure more similiar to the hydrated nickel hydoxide films previously reported in the literature.

Paper Details

Date Published: 6 March 1989
PDF: 15 pages
Proc. SPIE 1016, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion VII, (6 March 1989); doi: 10.1117/12.949915
Show Author Affiliations
Niall R Lynam, Donnelly Corporation (United States)
Hamid R. Habibi, Donnelly Corporation (United States)


Published in SPIE Proceedings Vol. 1016:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion VII
Claes-Goeran Granqvist; Carl M. Lampert, Editor(s)

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