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Proceedings Paper

Picosecond Semiconductor Lasers For Characterizing High-Speed Image Shutters
Author(s): T. S. Pagano; F. J. Janson; G. J. Yates; S. A. Jaramillo
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Paper Abstract

A portable system that utilizes solid state electronic timing circuits and a pulsed semiconductor laser for characterizing the optical gate sequence of high-speed image shutters, including microchannel-plate intensifier tubes (MCPTs), and silicon-intensified target vidicons (SITVs), is described and compared to earlier methods of characterization. Gate sequences obtained using the system and streak camera data of the semiconductor laser pulse are presented, with a brief discussion of the electronic delay timing and avalanche circuits used in the system.

Paper Details

Date Published: 14 January 1986
PDF: 6 pages
Proc. SPIE 0569, High Speed Photography, Videography, and Photonics III, (14 January 1986); doi: 10.1117/12.949858
Show Author Affiliations
T. S. Pagano, EG&G Energy Measurements, Inc. (United States)
F. J. Janson, EG&G Energy Measurements, Inc. (United States)
G. J. Yates, University of California (United States)
S. A. Jaramillo, University of California (United States)

Published in SPIE Proceedings Vol. 0569:
High Speed Photography, Videography, and Photonics III
Howard C. Johnson; Bernard G. Ponseggi, Editor(s)

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