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Proceedings Paper

OFDR Diagnostics For Fiber/Integrated Optic Systems And High Resolution Distributed Fiber Optic Sensing
Author(s): Stuart A. Kingsley; D.E . N . Davies
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Paper Abstract

Optical frequency domain reflectometry (OFDR) shows promise as a diagnostic tool for high resolution ranging in fiber optic networks/integrated optic devices, and for high resolution distributed fiber optic sensing. Chirped semiconductor lasers may be employed to obtain submillimeter spatial resolutions. This paper discusses applications, some signal processing aspects of this technology, the potential, and actual performance of some experimental laboratory OFDR systems.

Paper Details

Date Published: 3 January 1986
PDF: 11 pages
Proc. SPIE 0566, Fiber Optic and Laser Sensors III, (3 January 1986); doi: 10.1117/12.949800
Show Author Affiliations
Stuart A. Kingsley, Battelle Columbus Laboratories (United States)
D.E . N . Davies, University College London (United Kingdom)

Published in SPIE Proceedings Vol. 0566:
Fiber Optic and Laser Sensors III
Emery L. Moore; O. Glenn Ramer, Editor(s)

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