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Proceedings Paper

Layered Synthetic Microstructures for Long Wavelength X-Ray Spectrometry
Author(s): J. A. Nicolosi; R. Jenkins; J. P. Groven; D. Merlo
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Paper Abstract

We have recently, briefly described the properties of several types of Layered Synthetic Microstructures, (LSM) and their use in the measurement of elements traditionally covered by the acid Phthalate and Langmuir - Blodgett diffracting structures.1 In this application, the wavelength range is extended to cover oxygen, nitrogen, carbon and boron. One of the major problems in working in the longer wavelength region is that the large incremental difference in wavelength per atomic number step makes it difficult to achieve a good comprise between the wavelength range coverable with a given d-spacing and the angular dispersion achievable. It is possible to optimize these structures to provide excellent diffraction and dispersion properties over most of the long wavelength characteristic x-ray emission region. By developing structures which suppress higher order spectra and by clever selection of substrate composition, both performance and range of application are extended beyond initial expectations. This paper describes some of the work that has been done to provide such optimization and then discusses results obtained with typical LSM's.

Paper Details

Date Published: 6 May 1985
PDF: 7 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949690
Show Author Affiliations
J. A. Nicolosi, Philips Electronic Instruments (United States)
R. Jenkins, Philips Electronic Instruments (United States)
J. P. Groven, Philips Electronic Instruments (United States)
D. Merlo, Philips Electronic Instruments (United States)

Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)

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