Share Email Print

Proceedings Paper

Aspherization And Multilayer Coating Of A RITCHEY-CHRETIEN Telescope For A = 30.4 nm
Author(s): J. P. Chauvineau; D. Decanini; M . Mullot; L. Valiergue; J. P . Delaboudiniere
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A high vacuum system designed for the deposition of multilayers for soft X-ray mirrors is described. It is applied to the aspherization and multilayer coating of the mirrors of a solar Ritchey-Chretien telescope. In a first step, laterally graded boron layers are deposited on flat polished silica substrate in order to determine their thickness profile by visible light interferometry. The next step consists in the characterization ofmultilayers deposited on top of the boron layer. Grazing incidence X-ray interferometry is applied to the measurement of interface roughness ; the results are used to predict the performances of W/Si multilayers ; it is found that reflectivity values of about 25 % could be obtained for normal reflection at 30.4 nm.

Paper Details

Date Published: 6 May 1985
PDF: 5 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949677
Show Author Affiliations
J. P. Chauvineau, Universite Paris XI (France)
D. Decanini, UniversiteParis XI (France)
M . Mullot, Universite Paris XI (France)
L. Valiergue, Universite Paris XI (France)
J. P . Delaboudiniere, Laboratoire de Physique Stellaire et Planetaire du CNRS (France)

Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)

© SPIE. Terms of Use
Back to Top