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Proceedings Paper

Synchrotron Based Measurements Of The Soft X-Rayperformance Of Thin Film Multilayer Structures
Author(s): D. R . Kania; R. J. Bartlett; W. J. Trela
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Paper Abstract

There is a great interest in the application of thin film multilayer structures for x�ray optical elements. We have developed aparatus and techniques to measure the reflectivity of multilayer structures on flat substrates a function of energy at angles from grazing to near normal incidence using a synchrotron. We will present descriptions of our measurement techniques and aparatus along with a comparison between theoretical calculations and experimental data.

Paper Details

Date Published: 6 May 1985
PDF: 5 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949670
Show Author Affiliations
D. R . Kania, Los Alamos National Laboratory (United States)
R. J. Bartlett, Los Alamos National Laboratory (United States)
W. J. Trela, Los Alamos National Laboratory (United States)


Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)

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